PFDT350
Description
High aspect ratio probe for repeatable, accurate depth metrology and imaging on challenging structures such as deep trenches and pits, as encountered on semiconductor samples and optics. Designed for PeakForce Tapping operation on Dimension Icon. 350nm tall spike with 10nm end radius and 30nm base width.
Quantity = 5 per pack
Technical Data
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Key specification
Nom Min Max Tip Radius (nm): 10 Frequency (KHz): 55 35 75 Spring Constant (N/m): 0.25 0.1 0.4 Length (um): 110 100 120 Width (um): 40 38 42 Cantilever Thickness (um): 0.5 0.47 0.53 Reflex Coating: Reflective Aluminum Geometry: Special Tip Specification
Nom Min Max Tip Height (h): 5.5 3 8 Front Angle (FA): 15 13 17 Back Angle (BA): 25 23 27 Side Angle (SA): 17.5 15.5 19.5