FIB2-100A
Description
Bruker's Focused Ion Beam (FIB) line of probes are the industry standard silicon probe for deep trench measurement! All FIB probes are based upon a ~320kHz, 40N/m cantilever for use in standard tapping mode on any AFM. The FIB2-100A has an aspect ratio of 20:1, a 100nm wide spike at 2um from the tip apex. Aluminum reflective coating.
Quantity = 5 per pack
Technical Data
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Key specification
Nom Min Max Tip Radius (nm): 12.5 10 15 Frequency (KHz): 320 230 410 Spring Constant (N/m): 42 20 80 Length (um): 125 110 140 Width (um): 40 30 50 Cantilever Thickness (um): 4 3.25 4.75 Cantilever Material: Si Reflex Coating: Reflective Aluminum Geometry: Rectangular Tip Specification
Nom Min Max Tip Height (h): 12.5 10 15 Front Angle (FA): 1 0.5 1.5 Back Angle (BA): 1 0.5 1.5 Side Angle (SA): 1 0.5 1.5