AD-40-SS
Description
Super sharp conductive single crystal diamond probes; 40 N/m, 180 kHz, <5 nm ROC. This probe has a super sharp tip for highest resolution combined with a high spring constant, suitable for higher force and harder sample applications including: Topography imaging in PeakForce Tapping, Tappingmode, and contact mode; Electrical characterization with PeakForce TUNA, TUNA, CAFM; and Nanomechanics with PeakForce QNM, FASTForce Volume, contact resonance, nanoindentation. All Adama probes are now included in the Sader Method - Global Calibration Initiative.
Quantity = 5 per pack
Technical Data
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Key specification
Nom Min Max Tip Radius (nm): <5 Frequency (KHz): 180 100 300 Spring Constant (N/m): 40 20 60 Length (um): 225 215 235 Width (um): 28 23 33 Cantilever Thickness (um): 3 2.5 3.5 Cantilever Material: Si Reflex Coating: Single Crystal Diamond Geometry: Rectangular Tip Specification
Nom Min Max Tip Height (h): 12.5 10 15 Front Angle (FA): 25 20 30 Back Angle (BA): 15 10 20 Side Angle (SA): 22.5 17.5 27.5 Tip-side Coating: Single Crystal Diamond