AD-40-SS
Bruker BNS
Part No:AD-40-SS
$1,500.00
Taxes and shipping costs are calculated at checkout
Super sharp conductive single crystal diamond probes; 40 N/m, 180 kHz, <5 nm ROC. This probe has a super sharp tip for highest resolution combined with a high spring constant, suitable for higher force and harder sample applications including: Topography imaging in PeakForce Tapping, Tappingmode, and contact mode; Electrical characterization with PeakForce TUNA, TUNA, CAFM; and Nanomechanics with PeakForce QNM, FASTForce Volume, contact resonance, nanoindentation. All Adama probes are now included in the Sader Method - Global Calibration Initiative.
Quantity = 5 per pack
Key specification
| Nom | Min | Max | |
|---|---|---|---|
| Tip Radius (nm): | <5 | ||
| Frequency (KHz): | 180 | 100 | 300 |
| Spring Constant (N/m): | 40 | 20 | 60 |
| Length (um): | 225 | 215 | 235 |
| Width (um): | 28 | 23 | 33 |
| Cantilever Thickness (um): | 3 | 2.5 | 3.5 |
| Cantilever Material: | Si | ||
| Reflex Coating: | Single Crystal Diamond | ||
| Geometry: | Rectangular |
Tip Specification
| Nom | Min | Max | |
|---|---|---|---|
| Tip Height (h): | 12.5 | 10 | 15 |
| Front Angle (FA): | 25 | 20 | 30 |
| Back Angle (BA): | 15 | 10 | 20 |
| Side Angle (SA): | 22.5 | 17.5 | 27.5 |
| Tip-side Coating: | Single Crystal Diamond |
