DDESP-FM-V2
Description
Doped diamond coated conductive probes for electrical characterization and increased wear resistance on improved FESP-V2 cantilever. (For non-conductive hardened probes, see DLC-coated Model TESPD). Bruker's popular DDESP-FM-V2 electrical probe provide both fantastic wear resistance and robust conductivity due to the hard and highly conductive tip side doped diamond coating. Perfect for applications such as C-AFM, PeakForce TUNA, SCM, and PFM. For a stiffer cantilever version of this probe see DDESP-V2. Probe part numbers ending in -V2 provide: Tighter dimensional specifications for improved probe to probe consistency; More precise alignment of the tip to the cantilever apex; and Improved aesthetics.
Quantity = 10 per pack
Technical Data
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Key specification
Nom Min Max Tip Radius (nm): 100 150 Frequency (KHz): 105 80 130 Spring Constant (N/m): 6 3 12 Length (um): 225 215 235 Width (um): 35 33 37 Cantilever Thickness (um): 2.95 2.20 3.70 Cantilever Material: Si Reflex Coating: Reflective Aluminum Geometry: Rectangular Tip Specification
Nom Min Max Tip Height (h): 12.5 10 15 Front Angle (FA): 25 22.5 27.5 Back Angle (BA): 17.5 15 20 Side Angle (SA): 20 17.5 22.5 Tip-side Coating: Conductive Diamond