DDESP-V2
Bruker BNS
Part No:DDESP-V2-1PK
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Doped diamond coated conductive probes for electrical characterization and increased wear resistance on improved TESP-V2 cantilever. (For non-conductive hardened probes, see DLC-coated Model TESPD). Bruker's popular DDESP-V2 electrical probe provide both fantastic wear resistance and robust conductivity due to the hard and highly conductive tip side doped diamond coating. Perfect for applications such as C-AFM, PeakForce TUNA, SCM, SSRM, and PFM. Fr a softer cantilever version of this probe, see DDESP-FM-V2. Probe part numbers ending in -V2 provide: Tighter dimensional specifications for improved probe to probe consistency; More precise alignment of the tip to the cantilever apex; and Improved aesthetics.
Quantity = 10 per pack
Key specification
| Nom | Min | Max | |
|---|---|---|---|
| Tip Radius (nm): | 100 | 150 | |
| Frequency (KHz): | 450 | 300 | 600 |
| Spring Constant (N/m): | 80 | 30 | 180 |
| Length (um): | 125 | 115 | 135 |
| Width (um): | 40 | 38 | 42 |
| Cantilever Thickness (um): | 3.6 | 2.85 | 4.35 |
| Cantilever Material: | Si | ||
| Reflex Coating: | Reflective Aluminum | ||
| Geometry: | Rectangular |
Tip Specification
| Nom | Min | Max | |
|---|---|---|---|
| Tip Height (h): | 12.5 | 10 | 15 |
| Front Angle (FA): | 25 | 22.5 | 27.5 |
| Back Angle (BA): | 17.5 | 15 | 20 |
| Side Angle (SA): | 20 | 17.5 | 22.5 |
| Tip-side Coating: | Conductive Diamond |
