DDESP-V2
Description
Doped diamond coated conductive probes for electrical characterization and increased wear resistance on improved TESP-V2 cantilever. (For non-conductive hardened probes, see DLC-coated Model TESPD). Bruker's popular DDESP-V2 electrical probe provide both fantastic wear resistance and robust conductivity due to the hard and highly conductive tip side doped diamond coating. Perfect for applications such as C-AFM, PeakForce TUNA, SCM, SSRM, and PFM. Fr a softer cantilever version of this probe, see DDESP-FM-V2. Probe part numbers ending in -V2 provide: Tighter dimensional specifications for improved probe to probe consistency; More precise alignment of the tip to the cantilever apex; and Improved aesthetics.
Quantity = 10 per pack
Technical Data
-
Key specification
Nom Min Max Tip Radius (nm): 100 150 Frequency (KHz): 450 300 600 Spring Constant (N/m): 80 30 180 Length (um): 125 115 135 Width (um): 40 38 42 Cantilever Thickness (um): 3.6 2.85 4.35 Cantilever Material: Si Reflex Coating: Reflective Aluminum Geometry: Rectangular Tip Specification
Nom Min Max Tip Height (h): 12.5 10 15 Front Angle (FA): 25 22.5 27.5 Back Angle (BA): 17.5 15 20 Side Angle (SA): 20 17.5 22.5 Tip-side Coating: Conductive Diamond