DDLTESP-V2
Description
Bruker’s new series of conductive diamond coated probes provide consistent performance with high wear resistance in mechanical and electrical applications. In mechanical applications, these probes provide extreme wear resistance.
In electrical applications, these probes provide high performance in Scanning Spreading Resistance Microscopy (SSRM) and Piezoresponse Force Microscopy (PFM) to characterize advanced semiconductor devices, Microelectromechanical Systems (MEMS), and biosensors providing the prolonged tip lifetime in combination with boosted conductivity.
The DDLTESP-V2 probe provides:
High performance contact resonance imaging with Dimension Icon.
High electrical performance due to its consistent tip shape.
Sensitive nanoelectrical measurements with highly conductive coating.
High resolution electrical imaging with a sharp conductive tip.
High quality probe manufactured by Bruker AFM Probes.
High spring constant for contact resonance on hardest materials such as ceramics.
Other applications of this probe include: Scanning Capacitance Microscopy (SCM), conductivity measurements (C-AFM and PeakForce TUNA), and other electrical characterization applications.
Quantity = 10 per pack
Technical Data
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Key specification
Nom Min Max Tip Radius (nm): 100 150 Frequency (KHz): 280 190 380 Spring Constant (N/m): 95 45 190 Length (um): 225 215 235 Width (um): 40 38 42 Cantilever Thickness (um): 7 6 8 Reflex Coating: Reflective Aluminum Geometry: Rectangular Tip Specification
Nom Min Max Tip Height (h): 12.5 10 15 Front Angle (FA): 25 23 27 Back Angle (BA): 15 13 17 Side Angle (SA): 17.5 15.5 19.5 Tip-side Coating: Conductive Diamond