DDRFESP40

Bruker’s conductive diamond coated probes provide consistent performance with high wear resistance in mechanical and electrical applications. In mechanical applications, these probes provide extreme wear resistance. In electrical applications, these probes provide high performance in Scanning Spreading Resistance Microscopy (SSRM) and Piezoresponse Force Microscopy (PFM) to characterize advanced semiconductor devices, Microelectromechanical Systems (MEMS), and biosensors providing the prolonged tip lifetime in combination with boosted conductivity. The DDRFESP40 probe provides: High performance contact resonance imaging with Dimension Icon. High electrical performance due to its consistent tip shape. Sensitive nanoelectrical measurements with highly conductive coating. High resolution electrical imaging with a sharp conductive tip. High quality probe manufactured by Bruker AFM Probes. Low spring constant for contact resonance on softer materials such as polymers. Other applications of this probe include: Scanning Capacitance Microscopy (SCM), conductivity measurements (C-AFM and PeakForce TUNA), and other electrical characterization applications.   Quantity = 10 per pack