DNP-S10
Description
Premium Contact Mode or Fluid TappingMode imaging and force measurement probes, sharpened for higher resolution. Unmounted for all AFMs. Bruker's robust Silicon Nitride AFM probes have soft Silicon Nitride cantilevers with Silicon Nitride tips, and are ideal for: Contact imaging modes; Lateral force microscopy; Force modulation microscopy; and liquid operation. The range in force constants enables users to image extremely soft samples in contact mode as well as high load vs distance spectroscopy.
Quantity = 10 per pack
Technical Data
-
Key specification
Nom Min Max Tip Radius (nm): 10 40 Frequency (KHz): 65 50 80 Spring Constant (N/m): 0.35 0.175 0.7 Length (um): 120 115 125 Width (um): 25 20 30 Cantilever Thickness (um): 0.6 0.55 0.65 Cantilever Material: SiN Reflex Coating: Reflective Gold Geometry: Triangular Tip Specification
Nom Min Max Tip Height (h): 5.25 2.5 8 Front Angle (FA): 15 12.5 17.5 Back Angle (BA): 25 22.5 27.5 Side Angle (SA): 17.5 15 20