ESPA-V2
Description
10-pack of Premium Contact Mode or Fluid TappingMode imaging and force measurement probes on improved V2 cantilever. ESPA-V2 probes are high-quality etched silicon probes for contact mode imaging in air. Unmounted for use on standard AFMs. Bruker’s line of ESP high quality premium etched silicon probes set the industry standard for contact mode in air. The probe design provides: Tighter dimensional specifications for improved probe to probe consistency; Tighter alignment of the tip apex to the cantilever resulting in easier laser positioning over the tip; Improved probe quality & aesthetics. This AFM probe is unmounted for use on any AFM and is also available without Aluminum reflex coating as model ESP-V2.
Quantity = 10 per pack
Technical Data
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Key specification
Nom Min Max Tip Radius (nm): 8 12 Frequency (KHz): 13 9 17 Spring Constant (N/m): 0.2 0.05 0.4 Length (um): 450 440 460 Width (um): 50 48 52 Cantilever Thickness (um): 2 1.25 2.75 Cantilever Material: Si Reflex Coating: Reflective Aluminum Geometry: Rectangular Tip Specification
Nom Min Max Tip Height (h): 12.5 10 15 Front Angle (FA): 25 22.5 27.5 Back Angle (BA): 15 12.5 17.5 Side Angle (SA): 22.5 20 25