FASTSCAN-A
Description
Probes specifically engineered for fast scanning in air using the Dimension FastScan AFM. FASTSCAN-A probes deliver extreme imaging speed without loss of resolution or force control! Designed specifically for use with the Dimension FastScan AFM but can be used on other high speed AFM systems. Perform high resolution imaging and collect best quality data at line rates up to 20Hz. Scan up tp 100Hz on suitably flat samples. FASTSCAN-A probes use a novel ~30um triangular SiN lever with a high 1.4MHz frequency but just a 17N/m spring constant meaning wide compatibility with multiple sample types from polymers to semiconductor samples. A 5nm tip radius is optimally balanced for great resolution and longevity.
Quantity = 10 per pack
Technical Data
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Key specification
Nom Min Max Tip Radius (nm): 5 12 Frequency (KHz): 1400 800 2000 Spring Constant (N/m): 18 10 25 Length (um): 27 24 30 Width (um): 33 30 36 Cantilever Thickness (um): 0.58 0.53 0.63 Cantilever Material: SiN Reflex Coating: Reflective Aluminum Geometry: Triangular Tip Specification
Nom Min Max Tip Height (h): 5.25 2.5 8 Front Angle (FA): 15 12.5 17.5 Back Angle (BA): 25 22.5 27.5 Side Angle (SA): 17.5