FASTSCAN-A-G
Description
These probes are FASTSCAN-A but with a Au reflex coating instead of AI. FASTSCAN-A-G probes deliver extreme imaging speed without loss of resolution or force control. Designed specifically for use with the Dimension FastScan AFM but can be used on other high speed AFM systems. Perform high-resolution imaging and collect best quality data at line rates up to 20Hz. Scan up to 100Hz on suitably flat samples. FASTSCAN-A-G probes use a novel ~30nm triangular SiN lever with a high 1.4MHz frequency but just a 17N/m spring constant meaning wide capability with multiple sample types from polymers to semiconductor samples. A 5nm tip radius is optimally balanced for great resolution and longevity. All FastScan cantilevers have less than 3 degrees of cantilever bend.
Quantity = 10 per pack
Technical Data
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Key specification
Nom Min Max Tip Radius (nm): 5 12 Frequency (KHz): 1400 800 2000 Spring Constant (N/m): 18 10 25 Length (um): 27 24 33 Width (um): 33 30 36 Cantilever Thickness (um): 0.58 0.53 0.63 Cantilever Material: SiN Reflex Coating: Ti/Au Geometry: Triangular Tip Specification
Nom Min Max Tip Height (h): 5.25 2.5 8