FESPA-V2
Description
Premium soft TappingMode and Force Modulation probes on improved V2 cantilever. FESPA-V2 high quality etched silicon probes for soft TappingMode™ imaging and force modulation in air. Unmounted for use on standard AFM's. Bruker’s line of FESP high quality premium etched silicon probes set the industry standard for soft TappingMode imaging and force modulation in air. This design provides: Tighter dimensional specifications for improved probe to probe consistency; Tighter alignment of the tip apex to the cantilever resulting in easier laser positioning over the tip; and Improved probe quality & aesthetics. This AFM probe is unmounted for use on any AFM and is also available without Aluminum reflex coating as model FESP-V2.
Quantity = 10 per pack
Technical Data
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Key specification
Nom Min Max Tip Radius (nm): 8 12 Frequency (KHz): 75 50 100 Spring Constant (N/m): 2.8 1 5 Length (um): 225 215 235 Width (um): 35 33 37 Cantilever Thickness (um): 2.75 2.0 3.5 Cantilever Material: Si Reflex Coating: Reflective Aluminum Geometry: Rectangular Tip Specification
Nom Min Max Tip Height (h): 12.5 10 15 Front Angle (FA): 25 22.5 27.5 Back Angle (BA): 15 12.5 17.5 Side Angle (SA): 22.5 20 25