FM-LC
Description
High wear resistant diamond cone probe with high probe-to-probe consistency in tip shape and a tip-radius of 20nm. Ideally suited to long lifetime imaging on low relief samples at moderately high resolution. Conductive with a contact resistance in the 100kOhm range. Intermediate spring constant of 8N/m. For even higher resolution consider the AD series of diamond probes.Applications include: Topography imaging in PeakForce Tapping, Tappingmode, and contact mode. Electrical characterization with PeakForce TUNA, TUNA, CAFM. Nanomechanics with PeakForce QNM, FASTForce Volume, contact resonance, nanoindentation.
Quantity = 5 per pack
Technical Data
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Key specification
Nom Min Max Tip Radius (nm): 20 Frequency (KHz): 100 50 150 Spring Constant (N/m): 8 4 16 Length (um): 225 215 235 Width (um): 28 23 33 Cantilever Thickness (um): 3 2.5 3.5 Cantilever Material: Diamond cone probe Reflex Coating: Reflective Au Geometry: Rectangular Tip Specification
Nom Min Max Tip Height (h): 12.5 10 15 Front Angle (FA): 25 20 30 Back Angle (BA): 15 10 20 Side Angle (SA): 22.5 17.5 27.5 Tip-side Coating: Highly conductive single cystal diamond