FMV-PT
Description
A pack of Conductive Silicon Probes. Bruker's Value Line Probe for Electrical Characterization with soft TappingMode or other "AC/non-contact modes."
Specifications:
Tip radius of 25 nm nominal.
Platinum-Iridium coated, electrically conductive tip that is ideal for various electrical characterization applications.
The Pt-Ir coating on the front side of the cantilever provides ametallic electrical path from the cantilever die to the apex of the tip.
The coating on the back side of the cantilever enhances laser reflectivity.
Unmounted for all AFMs.
Quantity = 10 per pack
Technical Data
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Key specification
Nom Min Max Tip Radius (nm): 25 Frequency (KHz): 75 50 100 Spring Constant (N/m): 2.8 1 5 Length (um): 230 225 235 Width (um): 33 28 38 Cantilever Thickness (um): 2.75 2.0 3.5 Cantilever Material: Si Reflex Coating: Reflective PtIr Geometry: Rectangular Tip Specification
Nom Min Max Tip Height (h): 12.5 10 15 Front Angle (FA): 25 22.5 27.5 Back Angle (BA): 15 12.5 17.5 Side Angle (SA): 22.5 20 25 Tip-side Coating: Conductive Ptlr