HAR1-200A-10
Bruker BNS
Part No:HAR1-200A-10-1PK
Variation
$1,372.00
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Tilt-Compensated High Aspect Ratio (5:1) Focused Ion Beam (FIB) probes for high resolution TappingMode imaging on samples with tall/deep geometries
Quantity = 10 per pack
Key specification
| Nom | Min | Max | |
|---|---|---|---|
| Tip Radius (nm): | 10 | 15 | |
| Frequency (KHz): | 320 | 230 | 410 |
| Spring Constant (N/m): | 42 | 10 | 80 |
| Length (um): | 125 | 110 | 140 |
| Width (um): | 40 | 30 | 50 |
| Cantilever Thickness (um): | 4 | 3.5 | 4.5 |
| Cantilever Material: | Si | ||
| Reflex Coating: | Reflective Aluminum | ||
| Geometry: | Rectangular |
Tip Specification
| Nom | Min | Max | |
|---|---|---|---|
| Tip Height (h): | 10 | 15 | |
| Front Angle (FA): | 5 | 4.5 | 5.5 |
| Back Angle (BA): | 5 | 4.5 | 5.5 |
| Side Angle (SA): | 5 | 4.5 | 5.5 |
