HAR1-200A-10
Description
Tilt-Compensated High Aspect Ratio (5:1) Focused Ion Beam (FIB) probes for high resolution TappingMode imaging on samples with tall/deep geometries.
Specifications:
42 N/m, 320 kHz, 10 nm radius, Al reflex coating.
Compatible with most commercially available AFMs.
Quantity = 10 per pack
Technical Data
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Key specification
Nom Min Max Tip Radius (nm): 10 15 Frequency (KHz): 320 230 410 Spring Constant (N/m): 42 10 80 Length (um): 125 110 140 Width (um): 40 30 50 Cantilever Thickness (um): 4 3.5 4.5 Cantilever Material: Si Reflex Coating: Reflective Aluminum Geometry: Rectangular Tip Specification
Nom Min Max Tip Height (h): 10 15 Front Angle (FA): 5 4.5 5.5 Back Angle (BA): 5 4.5 5.5 Side Angle (SA): 5 4.5 5.5