HMXS-10
Description
A pack of HarmoniX Probes "Soft" version for nanoscale material property mapping of softer samples in the 0.5MPa to 1GPa hardness range. HMXS are significantly softer (about 5x) than HMX but with similar bandwidth. This makes HMXS better for:
Adhesion measurements where background noise can dominate. These probes are about 5x more sensitive (background noise levels of a few hundred pN).
High resolution on softer materials where peak forces must be small to control sample deformation.
Stiffness measurements on softer materials.
HMX probes are better for stiffer samples and sticky samples where the tip can get stuck to the surface. Unmounted for HamorniX-enabled, NS5-based AFMs.
Quantity = 10 per pack
Technical Data
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Key specification
Nom Min Max Tip Radius (nm): 10 12 Frequency (KHz): 40 25 55 Spring Constant (N/m): 1 0.3 2 Length (um): 300 290 310 Width (um): 25 20 30 Cantilever Thickness (um): 3 2.0 3.5 Cantilever Material: Si Reflex Coating: Reflective Aluminum Geometry: Rectangular Tip Specification
Nom Min Max Tip Height (h): 7 4 10 Front Angle (FA): 25 22.5 27.5 Back Angle (BA): 15 12.5 17.5 Side Angle (SA): 22.5 20 25