LTESPA-V2
Description
A pack of High quality long-lever etched silicon probes for TappingMode™ and other non-contact modes. Unmounted for use on standard AFM's. Bruker’s line of LTESP high quality premium etched silicon probes set the industry standard for long-lever TappingMode™ and non-contact mode in air. The new design provides:
Tighter dimensional specifications for improved probe to probe consistency.
Tighter alignment of the tip apex to the cantilever resulting in easier laser positioning. over the tip.
Improved probe quality & aesthetics.
This AFM probe is unmounted for use on any AFM and is also available with Aluminum reflex coating as model LTESP-V2.
Quantity = 10 per pack
Technical Data
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Key specification
Nom Min Max Tip Radius (nm): 8 12 Frequency (KHz): 190 130 250 Spring Constant (N/m): 48 24 96 Length (um): 225 215 235 Width (um): 40 38 42 Cantilever Thickness (um): 6.8 5.8 7.8 Cantilever Material: Si Reflex Coating: Reflective Aluminum Geometry: Rectangular Tip Specification
Nom Min Max Tip Height (h): 12.5 10 15 Front Angle (FA): 25 22.5 27.5 Back Angle (BA): 15 12.5 17.5 Side Angle (SA): 22.5 20 25