MESP-HM-V2
Description
Bruker's MESP-HM-V2 is the established choice for Magnetic Force Microscopy. Built on the high-performance RFESP-75 AFM probe, the hard Cobalt-Chromium coating on this tip is tailored for high-sensitivity and magnetic contrast. This cost-effective probe has a nominal tip radius of 80 nm for excellent lateral resolution for MFM, as well as other electrical and capacitance applications requiring a cantilever with conductive coating. The MESP-HM-V2 has a nominal coercivity of 400 Oe (medium), and a magnetic moment of 3e-13 EMU (high). The reflex side of the cantilever has a Co-Cr coating for increased reflectivity up to 2.5 times that of an uncoated probe. Bruker's MESP-HM-V2 probe replaces the legacy MESP-HM probe. Bruker recommends transitioning to this probe. The MESP-HM-V2 design provides:
Tighter dimensional specifications for improved probe to probe consistency.
Tighter alignment of the tip apex to the cantilever resulting in easier laser positioning. over the tip.
Improved probe quality & aesthetics.
Quantity = 10 per pack
Technical Data
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Key specification
Nom Min Max Tip Radius (nm): 80 100 Frequency (KHz): 75 50 100 Spring Constant (N/m): 3 1.5 6 Length (um): 225 215 235 Width (um): 35 33 37 Cantilever Thickness (um): 2.8 2.05 3.55 Cantilever Material: Si Reflex Coating: Reflective Co/Cr Geometry: Rectangular Tip Specification
Nom Min Max Tip Height (h): 12.5 10 15 Front Angle (FA): 17.5 15 20 Back Angle (BA): 25 22.5 27.5 Side Angle (SA): 20 17.5 22.5 Tip-side Coating: Magnetic

