MESP-LM-V2
Description
Low moment MFM Probes on improved V2 cantilever with a conductive coating that can often be an excellent and cost-effective solution for electrical and capacitance microscopy
Quantity = 10 per pack
Technical Data
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Key specification
Nom Min Max Tip Radius (nm): 25 35 Frequency (KHz): 75 50 100 Spring Constant (N/m): 3 1.5 6 Length (um): 225 215 235 Width (um): 35 33 37 Cantilever Thickness (um): 2.8 2.05 3.55 Cantilever Material: Si Reflex Coating: Reflective Co/Cr Geometry: Rectangular Tip Specification
Nom Min Max Tip Height (h): 12.5 10 15 Front Angle (FA): 17.5 15 20 Back Angle (BA): 25 22.5 27.5 Side Angle (SA): 20 17.5 22.5 Tip-side Coating: Magnetic