MFMV
Description
- *Price and availability may vary by region due to local costs and regulations
Bruker's Value Line Probe for Magnetic Force Microscopy. This cost- effective probe enables MFM imaging as well as other electrical and capacitance applications requiring a cantilever with a conductive coating.
Quantity = 10 per pack
Technical Data
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Key specification
Nom Min Max Tip Radius (nm): 40 Frequency (KHz): 75 50 100 Spring Constant (N/m): 2.8 1 5 Length (um): 230 225 235 Width (um): 33 28 38 Cantilever Thickness (um): 2.75 2.0 3.5 Cantilever Material: Si Reflex Coating: Reflective Co/Cr Geometry: Rectangular Tip Specification
Nom Min Max Tip Height (h): 12.5 10 15 Front Angle (FA): 25 22.5 27.5 Back Angle (BA): 15 12.5 17.5 Side Angle (SA): 22.5 20 25