NC-LC
Description
High wear resistant diamond cone probe with high probe-to-probe consistency in tip shape and a tip-radius of 20nm. Ideally suited to long lifetime imaging on low relief samples at moderately high resolution. Conductive with a contact resistance in the 100kOhm range. Intermediate spring constant of 8N/m. For even higher resolution consider the AD series of diamond probes. Applications include Topography imaging in PeakForce Tapping, Tappingmode, and contact mode.Electrical characterization with PeakForce TUNA, TUNA, CAFM.Nanomechanics with PeakForce QNM, FASTForce Volume, contact resonance, nanoindentation.
Quantity = 5 per pack
Technical Data
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Key specification
Nom Min Max Tip Radius (nm): 20 Frequency (KHz): 450 300 600 Spring Constant (N/m): 100 50 200 Length (um): 125 115 135 Width (um): 30 25 35 Cantilever Thickness (um): 4 3.5 4.5 Cantilever Material: Diamond cone probe Reflex Coating: Reflective Au Geometry: Rectangular Tip Specification
Nom Min Max Tip Height (h): 12.5 10 15 Front Angle (FA): 25 20 30 Back Angle (BA): 15 10 20 Side Angle (SA): 22.5 17.5 27.5 Tip-side Coating: Highly conductive single cystal diamond