NM-TC
Description
Nanomechanics Probe, 350 N/m, 750kHz, 25nm ROC, uncalibrated. These tips are specifically designed for high mechanical loads and scratch testing applications. By using wear-resistant diamond and a broad cone angle the contact size is well characterized and stays constant during repeated mechanical measurements. These probes have demonstrated highly repeatable deep (~100nm) indentations into materials such as fused silica and can image the indents at high resolution in-situ using the same probe. Each probe comes with a high-resolution SEM image showing the precise tip shape. A gold reflex coating deposited on the detector side of the cantilever to enhance the reflectance of the laser beam. All Adama probes are now included in the Sader Method - Global Calibration Initiative Nanomechanical modes: Tomography, nanoscratching, and nanoindentation, and their combination with PeakForce QNM, FASTForce Volume, or contact resonance.
Quantity = 5 per pack
Technical Data
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Key specification
Nom Min Max Tip Radius (nm): 25 35 Frequency (KHz): 750 500 1000 Spring Constant (N/m): 350 100 600 Length (um): 125 115 135 Width (um): 30 25 35 Cantilever Thickness (um): 4 Cantilever Material: Diamond Tip Specification
Nom Min Max Tip Height (h): 12.5 10 15 Front Angle (FA): 25 20 30 Back Angle (BA): 15 10 20 Side Angle (SA): 22.5 17.5 27.5

