OLTESPA-R4
Description
The OLTESPA-R4 is a visible apex tip. Just point the free end of the cantilever at the sample feature of interest when in the navigation GUI of your AFM and hit engage. The tip located directly beneath the cantilever apex will land in the perfect position for scanning every time! The probe also features a tetrahedral sharpened tip with a 7nm tip radius for crisp topographic images. A 70khz resonant frequency and 2N/m spring constant make this probe perfect for gentle imaging of samples in tapping mode whilst maintaining tip sharpness. Suitable for a wide range of polymeric, metallic, semiconductor, ceramic and similar samples.
Quantity = 10 per pack
Technical Data
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Key specification
Nom Min Max Tip Radius (nm): 7 10 Frequency (KHz): 70 50 90 Spring Constant (N/m): 2 0.6 3.5 Length (um): 240 255 225 Width (um): 40 38 42 Cantilever Thickness (um): 2.3 1.6 3.0 Cantilever Material: Si Reflex Coating: Reflective Al Geometry: Rectangular Tip Specification
Nom Min Max Tip Height (h): 14 9 19 Front Angle (FA): 0 Back Angle (BA): 35 Side Angle (SA): 18