OSCM-PT-R4
Description
- *Price and availability may vary by region due to local costs and regulations
OSCM-PT-R4 series probes have platinum-deposited cantilevers and are suitable for conducting scanning probe microscopy in air using electric force microscopy (EFM) or Kelvin probe force microscopy (KFM) modes, with an unprecedented sharpness of 20nm radius as a metal-coated probe.
These probes feature:
1) High resolution: The apex of 20 nm radius is prominently sharp among metal-coated probes (see the tip apex). The thin and sharp tetrahedral probe reveals sample surface precisely both electrically and topographically.
2) Visible apex tip: OSCM-PT-R4 has a tetrahedral tip on the exact end of the cantilever. Since the tip isn't hidden by the body of cantilever, it can be positioned exactly at a point of interest using an optical microscope.
Quantity = 10 per pack
Tip SpecificationTip Height (h): 9 - 19 µmFront Angle (FA): 0 ± 1ºBack Angle (BA): 35 ±1ºSide Angle (SA): 18 ±1ºCantilever SpecificationAluminum reflective coating on the backside of the cantilever. The Al Reflective coating increases the laser signal (A+B) by up to 2.5 times. Although not necessary for general imaging, reflective coating is recommended for thin cantilevers, highly reflective samples, and machine vision applications.
Material: 0.01 - 0.02 Ωcm SiliconGeometry: RectangularCantilevers Number: 1Cantilever Thickness (Nom): 2.3µmCantilever Thickness (RNG): 1.6 - 3.0µmBack Side Coating: Reflective AluminumTop Layer Back: 100 nm of Al
