OTESPA-R4
Description
The OTESPA-R4 is a visible apex tip. Just point the free end of the cantilever at the sample feature of interest when in the navigation GUI of your AFM and hit engage. The tip located directly beneath the cantilever apex will land in the perfect position for scanning every time! The probe also features a tetrahedral sharpened tip with a 7nm tip radius for crisp topographic images. A 300khz resonant frequency and 26N/m spring constant make this an industry standard probe for regular tapping mode-based topography. Suitable for a wide range of polymeric, metallic, semiconductor, ceramic and similar samples.
Quantity = 10 per pack
Technical Data
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Key specification
Nom Min Max Tip Radius (nm): 7 Frequency (KHz): 300 200 400 Spring Constant (N/m): 26 8.4 57 Length (um): 160 145 175 Width (um): 40 38 42 Cantilever Thickness (um): 3.7 3.2 4.2 Cantilever Material: Si Reflex Coating: Reflective Aluminum Geometry: Rectangular Tip Specification
Nom Min Max Tip Height (h): 14 9 19 Front Angle (FA): 0 -1 1 Back Angle (BA): 35 34 36 Side Angle (SA): 18 17 19