RESPA-40
Bruker BNS
Part No:RESPA-40-1PK
Variation
$404.25
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Premium High-Resolution Contact mode silicon probes on improved V2 cantilever. This probe uses a rotated tip to provide a more symmetric representation of features over 200nm
Quantity = 10 per pack
Key specification
| Nom | Min | Max | |
|---|---|---|---|
| Tip Radius (nm): | 8 | 12 | |
| Frequency (KHz): | 40 | 30 | 50 |
| Spring Constant (N/m): | 5 | 3 | 10 |
| Length (um): | 450 | 440 | 460 |
| Width (um): | 40 | 38 | 42 |
| Cantilever Thickness (um): | 6.25 | 5.25 | 7.25 |
| Cantilever Material: | Si | ||
| Reflex Coating: | Reflective Aluminum | ||
| Geometry: | Rectangular |
Tip Specification
| Nom | Min | Max | |
|---|---|---|---|
| Tip Height (h): | 12.5 | 10 | 15 |
| Front Angle (FA): | 15 | 13 | 17 |
| Back Angle (BA): | 25 | 23 | 27 |
| Side Angle (SA): | 17.5 | 15.5 | 19.5 |
