RFESPG-75
Description
This is the gold coated version of RFESP-75. High quality etched silicon probes for soft TappingMode™ imaging and force modulation in air. Unmounted for use on standard AFM's. Premium High-Resolution Force Modulation silicon probes on improved V2 cantilever with gold-coated tip. This probe uses a rotated tip to provide a more symmetric representation of features over 200nm.With precisely controlled cantilever geometry to enable repeatable scanning parameters, an extra sharp tip radius to reduce the AFM's minimum detectable feature size, and a taller tip to minimize squeeze film damping, the MPP is the industry standard for high-performance and high-quality imaging on a wide variety of sample types. The new design provides:
Tighter dimensional specifications for improved probe to probe consistency.
Tighter alignment of the tip apex to the cantilever resulting in easier laser positioning over the tip.
Improved probe quality & aesthetics.
Quantity = 10 per pack
Technical Data
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Key specification
Nom Min Max Tip Radius (nm): 8 12.5 Frequency (KHz): 75 50 100 Spring Constant (N/m): 3 1.5 6 Length (um): 225 215 235 Width (um): 35 33 37 Cantilever Thickness (um): 2.8 2.05 3.55 Cantilever Material: Si Reflex Coating: Ti/Au Geometry: Rectangular Tip Specification
Nom Min Max Tip Height (h): 12.5 10 15 Front Angle (FA): 17.5 15 20 Back Angle (BA): 25 22.5 27.5 Side Angle (SA): 20 17.5 22.5

