RFESPG-75
Description
- *Price and availability may vary by region due to local costs and regulations
Premium High-Resolution Force Modulation silicon probes on improved V2 cantilever. This probe uses a rotated tip to provide a more symmetric representation of features over 200nm
Quantity = 10 per pack
Technical Data
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Key specification
Nom Min Max Tip Radius (nm): 8 12.5 Frequency (KHz): 75 50 100 Spring Constant (N/m): 3 1.5 6 Length (um): 225 215 235 Width (um): 35 33 37 Cantilever Thickness (um): 2.8 2.05 3.55 Cantilever Material: Si Reflex Coating: Ti/Au Geometry: Rectangular Tip Specification
Nom Min Max Tip Height (h): 12.5 10 15 Front Angle (FA): 17.5 15 20 Back Angle (BA): 25 22.5 27.5 Side Angle (SA): 20 17.5 22.5