RTESPA-300
Bruker BNS
Part No:RTESPA-300-1PK
Variation
$404.25
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Premium High-Resolution TappingMode silicon probes on improved V2 cantilever. This probe uses a rotated tip to provide a more symmetric representation of features over 200nm
Quantity = 10 per pack
Key specification
| Nom | Min | Max | |
|---|---|---|---|
| Tip Radius (nm): | 8 | 12 | |
| Frequency (KHz): | 200 | 300 | 400 |
| Spring Constant (N/m): | 40 | 20 | 80 |
| Length (um): | 125 | 115 | 135 |
| Width (um): | 40 | 38 | 42 |
| Cantilever Thickness (um): | 3.4 | 2.65 | 4.15 |
| Cantilever Material: | Si | ||
| Reflex Coating: | Reflective Aluminum | ||
| Geometry: | Rectangular |
Tip Specification
| Nom | Min | Max | |
|---|---|---|---|
| Tip Height (h): | 12.5 | 10 | 15 |
| Front Angle (FA): | 15 | 13 | 17 |
| Back Angle (BA): | 25 | 23 | 27 |
| Side Angle (SA): | 17.5 | 15.5 | 19.5 |
