RTESPA-300
Description
RTESPA-300 is our best performing, best selling tapping mode probe! An industry standard 300kHz, 40N/m, ~100um long, rectangular cantilever paired with a rotated, 15um tall and 8nm radius tip. Get the best tapping mode topography and phase images on everything from polymers to ceramics, metals to semiconductors. Compatible with all AFMs. This AFM probe is unmounted for use on any AFM and is also available without Aluminum reflex coating as model RTESP-300.
Quantity = 10 per pack
Technical Data
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Key specification
Nom Min Max Tip Radius (nm): 8 12 Frequency (KHz): 200 300 400 Spring Constant (N/m): 40 20 80 Length (um): 125 115 135 Width (um): 40 38 42 Cantilever Thickness (um): 3.4 2.65 4.15 Cantilever Material: Si Reflex Coating: Reflective Aluminum Geometry: Rectangular Tip Specification
Nom Min Max Tip Height (h): 12.5 10 15 Front Angle (FA): 15 13 17 Back Angle (BA): 25 23 27 Side Angle (SA): 17.5 15.5 19.5