SCM-PIC-V2
Description
- *Price and availability may vary by region due to local costs and regulations
Premium coated silicon probe for Scanning Capacitance Mode (SCM) contact mode imaging and electrical characterization on improved V2 cantilever
Quantity = 10 per pack
Technical Data
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Key specification
Nom Min Max Tip Radius (nm): 25 Frequency (KHz): 10 4 16 Spring Constant (N/m): 0.1 0.03 0.2 Length (um): 450 440 460 Width (um): 35 33 37 Cantilever Thickness (um): 1.8 1.05 2.55 Cantilever Material: Si Reflex Coating: Reflective PtIr Geometry: Rectangular Tip Specification
Nom Min Max Tip Height (h): 12.5 10 15 Front Angle (FA): 17.5 15 20 Back Angle (BA): 25 22.5 27.5 Side Angle (SA): 20 17.5 22.5 Tip-side Coating: PtIr