SCM-PIC-V2
Bruker BNS
Part No:SCM-PIC-V2-1PK
Variation
$520.00
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Premium coated silicon probe for Scanning Capacitance Mode (SCM) contact mode imaging and electrical characterization on improved V2 cantilever
Quantity = 10 per pack
Key specification
| Nom | Min | Max | |
|---|---|---|---|
| Tip Radius (nm): | 25 | ||
| Frequency (KHz): | 10 | 4 | 16 |
| Spring Constant (N/m): | 0.1 | 0.03 | 0.2 |
| Length (um): | 450 | 440 | 460 |
| Width (um): | 35 | 33 | 37 |
| Cantilever Thickness (um): | 1.8 | 1.05 | 2.55 |
| Cantilever Material: | Si | ||
| Reflex Coating: | Reflective PtIr | ||
| Geometry: | Rectangular |
Tip Specification
| Nom | Min | Max | |
|---|---|---|---|
| Tip Height (h): | 12.5 | 10 | 15 |
| Front Angle (FA): | 17.5 | 15 | 20 |
| Back Angle (BA): | 25 | 22.5 | 27.5 |
| Side Angle (SA): | 20 | 17.5 | 22.5 |
| Tip-side Coating: | PtIr |
