SCM-PIC-V2

Built on the high-performance RESP-10 AFM probe, Bruker's SCM-PIC-V2 probe has a Platinum-Iridium coated, electrically conductive tip that is ideal for Electrical Force Microscopy (EFM), Kelvin Probe Force Microscopy (KPFM), Scanning Capacitance Microscopy (SCM), and other electrical characterization applications. The Pt-Ir coating on the front side of the cantilever provides a metallic electrical path from the cantilever die to the apex of the tip. The coating on the back side of the cantilever compensates for the stress created by the front side coating and also enhances laser reflectivity by a factor of up to 2.5 times. AFM users with Bruker's latest electrical characterization techniques based upon PeakForce Tapping technology should consider using PFTUNA or PFQNE-AL probes. Bruker's SCM-PIC-V2 probe replaces the legacy SCM-PIC probe. Bruker recommends transitioning to this probe. The SCM-PIC-V2 design provides: Tighter dimensional specifications for improved probe to probe consistency. Tighter alignment of the tip apex to the cantilever resulting in easier laser positioning over the tip. Improved probe quality & aesthetics. Quantity = 10 per pack