SCM-PTSI

For the highest resolution nanoelectrical measurements with outstanding wear resistance. Bruker's platinum silicide AFM probe is the ideal choice for Scanning Capacitance Microscopy measurements, conductivity measurements (Conductive AFM (C-AFM) and PeakForce TUNA), Electrical Force Microscopy (EFM), and other characterization applications. on the most advanced semiconductor features, providing the highest resolution imaging and long tip lifetime due to its outstanding wear resistant properties. The Bruker SCM-PtSi probe provides:• High resolution electrical imaging with an ultra-sharp conductive tip. Consistent performance with high measurement lifetime. Highly sensitive nanoelectrical measurements. Bruker Atomic Force Microscopy group also provides many other nano-electrical probes and modes for AFM based electrical measurements including our unique PeakForce KPFM & PeakForce TUNA modes. Quantity = 10 per pack