SCM-PTSI
Description
- *Price and availability may vary by region due to local costs and regulations
Built on the high-performance FESP AFM probe, Bruker's SCM-PtSi probe has a Platinum-Silicide coated tip with outstanding wear-out behavior, high electrical resolution, excellent conductivity, and chemically inertness that is ideal for Scanning Capacitance Microscopy (SCM), conductivity measurement (CAFM and PFTUNA), Electrical Force Microscopy (EFM), Kelvin Probe Force Microscopy (KPFM), and other electrical characterization applications. The Pt-Si coating on the front side of the cantilever provides a metallic electrical path from the cantilever die to the apex of the tip.
Quantity = 10 per pack
Technical Data
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Key specification
Nom Min Max Tip Radius (nm): 15 20 Frequency (KHz): 75 50 100 Spring Constant (N/m): 2.8 1 5 Length (um): 225 200 250 Width (um): 28 23 33 Cantilever Thickness (um): 2.75 2.0 3.5 Cantilever Material: Si Reflex Coating: Reflective Al Geometry: Rectangular Tip Specification
Nom Min Max Tip Height (h): 12.5 10 15 Front Angle (FA): 25 22.5 27.5 Back Angle (BA): 17.5 15 20 Side Angle (SA): 20 17.5 22.5 Tip-side Coating: Conductive PtSi