SCM-PTSI
Bruker BNS
Part No:SCM-PTSI-1PK
Variation
$1,760.00
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Built on the high-performance FESP AFM probe, Bruker's SCM-PtSi probe
has a Platinum-Silicide coated tip with outstanding wear-out behavior,
high electrical resolution, excellent conductivity, and chemically
inertness that is ideal for Scanning Capacitance Microscopy (SCM),
conductivity measurement (CAFM and PFTUNA), Electrical Force Microscopy
(EFM), Kelvin Probe Force Microscopy (KPFM), and other electrical
characterization applications. The Pt-Si coating on the front side of
the cantilever provides a metallic electrical path from the cantilever
die to the apex of the tip.
Quantity = 10 per pack
Key specification
| Nom | Min | Max | |
|---|---|---|---|
| Tip Radius (nm): | 15 | 20 | |
| Frequency (KHz): | 75 | 50 | 100 |
| Spring Constant (N/m): | 2.8 | 1 | 5 |
| Length (um): | 225 | 200 | 250 |
| Width (um): | 28 | 23 | 33 |
| Cantilever Thickness (um): | 2.75 | 2.0 | 3.5 |
| Cantilever Material: | Si | ||
| Reflex Coating: | Reflective Al | ||
| Geometry: | Rectangular |
Tip Specification
| Nom | Min | Max | |
|---|---|---|---|
| Tip Height (h): | 12.5 | 10 | 15 |
| Front Angle (FA): | 25 | 22.5 | 27.5 |
| Back Angle (BA): | 17.5 | 15 | 20 |
| Side Angle (SA): | 20 | 17.5 | 22.5 |
| Tip-side Coating: | Conductive PtSi |
