SMIM-300
Description
Coaxially shielded probe with a solid metal probe tip, from Prime Nano Inc (model 5-300N), to work with the Scanning Microwave Impedance Microscopy module. This 300um long, 1N/m probe is recommended for contact mode measurements and sub resonant intermittent contact modes like force volume and Peak Force Tapping.
Quantity = 5 per pack
Technical Data
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Key specification
Nom Min Max Tip Radius (nm): 50 40 60 Frequency (KHz): 19 17 21 Spring Constant (N/m): 1 0.8 1.2 Length (um): 300 295 305 Width (um): 50 47 53 Cantilever Thickness (um): 3.6 3.3 3.9 Cantilever Material: SiN Reflex Coating: TiW/Au (500) Geometry: Rectangular Tip Specification
Nom Min Max Tip Height (h): 5 4.5 5.5 Front Angle (FA): 35 34 36 Back Angle (BA): 35 34 36 Side Angle (SA): 35 34 36 Tip-side Coating: TiW