TESPA-V2
Description
- *Price and availability may vary by region due to local costs and regulations
Pack of 10 High quality etched silicon probes for TappingMode™ and other non-contact modes. Unmounted for use on standard AFM's.
The new design provides:
Bruker AFM Probes has introduced an improved version of its popular, TESP/TESPA AFM probes. Bruker’s new line of TESP high quality premium etched silicon probes set the industry standard for TappingMode™ and non-contact mode in air.- Tighter dimensional specifications for improved probe to probe consistency.
- Tighter alignment of the tip apex to the cantilever resulting in easier laser positioning over the tip.
- Improved probe quality & aesthetics
This AFM probe is unmounted for use on any AFM and is also available without Aluminum reflex coating as model TESP-V2.
The current model TESPA is available for ordering through early 2014 at which point, it will become obsolete.
Quantity = 10 per pack
Technical Data
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Key specification
Nom Min Max Tip Radius (nm): 7 10 Frequency (KHz): 320 270 370 Spring Constant (N/m): 37 19 55 Length (um): 123 120 125 Width (um): 40 37 42 Cantilever Thickness (um): 3.3 2.8 3.8 Cantilever Material: Si Reflex Coating: Reflective Aluminum Geometry: Rectangular Tip Specification
Nom Min Max Tip Height (h): 12.5 10 15 Front Angle (FA): 25 22.5 27.5 Back Angle (BA): 17.5 15 20 Side Angle (SA): 20 17.5 22.5