TESPA-V2
Bruker BNS
Part No:TESPA-V2-1PK
Variation
$397.00
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Pack of 10 High quality etched silicon probes for TappingMode™ and other
non-contact modes. Unmounted for use on standard AFM's.
Bruker AFM Probes has introduced an improved version of its popular,
TESP/TESPA AFM probes. Bruker’s new line of TESP high quality premium
etched silicon probes set the industry standard for TappingMode™ and
non-contact mode in air.
- Tighter dimensional specifications for improved probe to probe consistency.
- Tighter alignment of the tip apex to the cantilever resulting in easier laser positioning over the tip.
- Improved probe quality & aesthetics
This AFM probe is unmounted for use on any AFM and is also available
without Aluminum reflex coating as model TESP-V2.
The current model TESPA is available for ordering through early 2014 at
which point, it will become obsolete.
Quantity = 10 per pack
Key specification
| Nom | Min | Max | |
|---|---|---|---|
| Tip Radius (nm): | 7 | 10 | |
| Frequency (KHz): | 320 | 270 | 370 |
| Spring Constant (N/m): | 37 | 19 | 55 |
| Length (um): | 123 | 120 | 125 |
| Width (um): | 40 | 37 | 42 |
| Cantilever Thickness (um): | 3.3 | 2.8 | 3.8 |
| Cantilever Material: | Si | ||
| Reflex Coating: | Reflective Aluminum | ||
| Geometry: | Rectangular |
Tip Specification
| Nom | Min | Max | |
|---|---|---|---|
| Tip Height (h): | 12.5 | 10 | 15 |
| Front Angle (FA): | 25 | 22.5 | 27.5 |
| Back Angle (BA): | 17.5 | 15 | 20 |
| Side Angle (SA): | 20 | 17.5 | 22.5 |
