TESPA-V2-SS
Description
TESPA-V2-SS, SUPERSHARP, 10-PACK. Pack of 10 High quality etched silicon probes with backside Aluminum reflex coating, for TappingMode™ and other non-contact modes. Unmounted for use on standard AFMs. Super Sharp TESPA probe based off of our TESPA-V2 probe combines the high consistency of the V2 design with a high aspect ratio, supersharp tip guaranteed by Bruker's proprietary process. The small spike is processed to < 10 degree half angles for the first 200 nm of the tip apex.
42 N/m, 320 kHz.
2-5 nm tip radius of curvature.
Quantity = 10 per pack
Technical Data
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Key specification
Nom Min Max Tip Radius (nm): 2 5 Frequency (KHz): 320 270 370 Spring Constant (N/m): 37 19 55 Length (um): 123 120 125 Width (um): 40 37 42 Cantilever Thickness (um): 3.3 2.8 3.8 Cantilever Material: Si Reflex Coating: Reflective Aluminum Geometry: Rectangular Tip Specification
Nom Min Max Tip Height (h): 12.5 Front Angle (FA): 25 Back Angle (BA): 17.5 20 Side Angle (SA): 20